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Field-free analytical UHR SEM for materials characterization at nanoscale

  • Uncompromised characterization of all types of materials at the nanoscale
  • Ideal for characterization of materials at low beam energies for maximum surface topography
  • Excellent imaging of beam-sensitive and non-conductive samples
  • Fully automated setup of electron beam – optimal imaging conditions are guaranteed by the In-Flight Beam Tracing™
  • Intuitive live SEM navigation on the sample at magnification as low as 2× without the need of extra optical navigation camera thanks to the Wide Field Optics™ design
  • Unique In-Beam Multidetector design allowing angle and energy selective BSE detection
  • Intuitive software modular platform designed for effortless operation regardless users’ skill level