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Advanced UHR SEM and STEM imaging for characterization of your biological and beam-sensitive samples

  • UHR imaging of non-conductive beam sensitive samples at low-kV
  • A routine investigation of heavy-metal stained ultra-thin sections with excellent contrast using the In-beam BSE detector at extremely low kV
  • Easy-to-use STEM detector as a cost-effective alternative to routinely used TEM

  • Compatibility with major cryo-system suppliers on the market
  • Easy-to-use, fully customizable, application-oriented and modular user interface